This National Science Foundation news release presents a newly introduced technique, involving simple materials and instruments, for studying the mechanical properties of nanometer films. The release explains how these measurements are made and why they are important.
National Science Foundation. A New Wrinkle in Thin Film Science. Arlington: National Science Foundation, August 3, 2007. http://www.nsf.gov/news/news_summ.jsp?cntn_id=109673&org=NSF (accessed 24 April 2014).
%0 Electronic Source %D August 3, 2007 %T A New Wrinkle in Thin Film Science %I National Science Foundation %V 2014 %N 24 April 2014 %8 August 3, 2007 %9 image/jpeg %U http://www.nsf.gov/news/news_summ.jsp?cntn_id=109673&org=NSF
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